摘要：
本发明涉及集成电路测试领域,公开了一种时钟芯片测试方法和系统. The present invention relates to the field of integrated circuit testing, it discloses a method and system clock chip testing. 本发明中,根据时钟芯片测试原理,设计并制造测试负载板和被测器件接口,在时钟芯片的存储器能够正常工作时,检验晶振频率的精度,并在时钟芯片的工作温度范围内,采用高精密度频率计对晶振频率进行测量,并根据测量值计算在时钟芯片的工作温度范围内,晶振频率的温度补偿值,存入时钟芯片的存储器,之后再读出,并在读取的数值符合预先设定的模拟曲线时,判定时钟芯片通过温度补偿测试. The present invention is based on the clock chip testing principles, design and manufacturing test load board and the DUT interface when working by the clock chip memory, test the oscillator frequency accuracy in the clock chip and the operating temperature range, high precision frequency meter frequency of the oscillator is measured and calculated in the clock chip operating temperature range, temperature-compensated crystal frequency values stored in the memory chip clock, and then read out the measured values and the value read in line with when the pre-set simulation curve is determined by the temperature compensated clock chip test. 从而使得时钟芯片的晶振频率在零下40度至85度较宽的温度范围内得到温度补偿测试,提高时钟精度. So that the crystal frequency clock chip temperature compensation to get tested at minus 40 degrees to 85 degrees wide temperature range, improve the accuracy of the clock.
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